Detector | Arrival at Columbia University | Departure from Columbia University | ||||||
HE2 | February 8, 1995 | July 26, 1995 | ||||||
HE1 | June 2, 1995 | July 26, 1995 | ||||||
LE2 | July 20, 1995 | September 18, 1995 | ||||||
LE1 | July 24, 1995 | October 4, 1995 |
The calibration tests were performed in order to determine the IPC response to known inputs, measure IPC performance, and measure temperature dependencies. The following is a detailed report on the Columbia University calibration including descriptions of the testing setups and data taking procedures, explanation of data analysis methods, presentation of the results, and discussion of the results. The report is divided into the following sections: 5.2 Equipment Used During the Calibration, 5.3 Electronics Calibration and Testing, 5.4 X-Ray Response, 5.5 Position Response, 5.6 Spatial Uniformity of Energy Resolution, Gas Gain, and Efficiency, 5.7 Spark Testing, and 5.8 LE1 "Bright Spot".
5.2 Equipment Used During the Calibration
5.2.1 Electronic Components Used for Signal Processing
Data acquisition is triggered as follows. The Slow Anode signal is sent to a single channel analyzer (SCA), which produces a digital pulse if the input signal has an amplitude between the upper and lower threshold levels. The output of the SCA is inverted using a NAND gate and sent to the ADC trigger input.
The ADC channel assignments for the seven analog channels are shown below.
Analog Signal | Slow Anode | Fast Anode | Sideanti | Backanti | Strip | Wedge | Zee | ||||||||||||||
ADC Channel | 0 | 1 | 2 | 3 | 4 | 5 | 6 |
The following Tennelec components were used to process the IPC signals during the calibration: TC243 - shaping amplifiers for the Slow Anode, Backanti, Sideanti, Wedge, Strip, and Zee electronics channels, TC309 - linear gate and stretcher for the Slow Anode electronics channel, TC310 - linear gates and stretchers for the other electronics channels. A TC253 - Dual Sum and invert module was used as an inverter, and a TC450 - Single Channel Analyzer was used to trigger data acquisition. An Ortec 579 fast filter amplifier was used as the shaping amplifier for the Fast Anode. A Texas Instruments 7400 NAND gate was used as an inverter. For analog to digital conversion, a Data Translation model DT2824-PGH digital input-output and ADC board for IBM AT-compatible computers was used.
5.2.2 Other Devices Connected to the IPCs
Pulsers: Two BNC Model BH-1 Tail Pulse Generators were used to send pulses to the preamplifier test pulse inputs.
Power supplies: Power was provided for the IPC preamplifiers using two Uniply 6050D power supplies. A Trygon electronics SHR 40 supply was used to power the 7400 NAND gate used as an inverter. A low voltage power supply was also used to power the flight model HVPSs. Occasionally, testing of the IPCs required the use of high voltage power supplies other than the flight model HVPSs. In this case, two Bertan model 305 power supplies were used to supply power to the Anode and Anti high voltage electronics chains, and a Bertan model 301 was used to supply power to the Cathode high voltage electronics chain.
Electronic Monitoring and Measurement: A Tennelec TC535P Timer/Multi-Scaler was connected to the output of the SCA to monitor the number of acquired events. A Tektronix 2465 Oscilloscope and a Fluke 8050A Digital Multimeter were used to make various signal and low voltage DC measurements. To make high voltage measurements, Sensitive Research 500 V, 2 kV, and 5 kV electrostatic voltmeters were used.
Computer equipment: Two Dell 433SE computers were used during the calibration. Both contained 486 processors and 1542 Adaptec Host Adapters which allowed for connections to optical disk drives. One of the computers functioned as a data acquisition computer. It contained the ADC board described above. The other computer functioned as a data analysis computer. A Pinnacle Micro RCD-1000 recordable CD-ROM device was also used for data storage. All the data taken during the calibration was saved to both optical disk and CD-ROM.
Two software packages are used to analyze the data. One package, written in C++, is named "look". Look allows the user to produce histograms and "scatter plots" to display the data. During the calibration, look was used as a quick way to check the acquired data. The other software package is called "cart" and is written in IDL and C++. Cart has been used to perform a detailed analysis of the calibration data.
Source | Half-Life (years) | Type of Decay | Particle Emission | Photon Emission | ||||||||||||||
Energy (keV) | Probability | Energy (keV) | Probability | |||||||||||||||
55Fe | 2.73 | Electron Capture | None | None | 5.89 | 24% | ||||||||||||
6.49 | 2.9% | |||||||||||||||||
57Co | 0.745 | Electron Capture | None | None | 6.40 | 55% | ||||||||||||
14 | 10% | |||||||||||||||||
122 | 86% | |||||||||||||||||
136 | 11% | |||||||||||||||||
109Cd | 1.267 | Electron Capture | Auger electrons: | |||||||||||||||
63 | 41% | 88 | 3.6% | |||||||||||||||
84 | 45% | 22 | 100% | |||||||||||||||
87 | 9% |
Thermal Cycling Equipment: The IPC response to temperature variations was tested by placing the IPC on a VWR Scientific Series 400 HPS hot plate. An insulating cover, the "bake-o-matic" was made of two cardboard boxes of different sizes with insulation filling the gap between them. To measure the temperature of the IPC body an Omega model HH21 thermocouple was used.
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